Adaptive 3D-IC TSV Fault Tolerance Structure Generation
Publication in refereed journal

香港中文大學研究人員
替代計量分析
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其它資訊
摘要In 3-D integrated circuits (3D-ICs), through silicon via (TSV) is a critical technique in providing vertical connections. However, the yield is one of the key obstacles to adopt the TSV-based 3D-ICs technology in industry. Various fault-tolerance structures using spare TSVs to repair faulty functional TSVs have been proposed in literature for yield and reliability enhancement, but a valid structure cannot always be found due to the lack of effective generation methods for fault-tolerance structures. In this paper, we focus on the problem of adaptive fault-tolerance structure (AFTS) generation. Given the relations between functional TSVs and spare TSVs, we first calculate the maximum number of tolerant faults in each TSV group. Then we propose an integer linear programming-based model to construct the AFTS with minimal multiplexer delay overhead and hardware cost. We further develop a speed-up technique through an efficient min-cost-max-flow model. All the proposed methodologies are embedded in a top-down TSV planning framework to form functional TSV groups and generate AFTSs. Experimental results show that, compared with state-of-the-art, the number of spare TSVs used for fault tolerance can be effectively reduced.
著者Song Chen, Qi Xu, Bei Yu
期刊名稱IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
出版年份2019
月份5
卷號38
期次5
出版社IEEE
頁次949 - 960
國際標準期刊號0278-0070
電子國際標準期刊號1937-4151
語言美式英語

上次更新時間 2020-28-05 於 02:04