Hybrid Anodic and Metal-Assisted Chemical Etching Method Enabling Fabrication of Silicon Carbide Nanowires
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AbstractSilicon carbide (SiC) is one of the most important third-generation semiconductor materials. However, the chemical robustness of SiC makes it very difficult to process, and only very limited methods are available to fabricate nanostructures on SiC. In this work, a hybrid anodic and metal-assisted chemical etching (MACE) method is proposed to fabricate SiC nanowires based on wet etching approaches at room temperature and under atmospheric pressure. Through investigations of the etching mechanism and optimal etching conditions, it is found that the metal component plays at least two key roles in the process, i.e., acting as a catalyst to produce hole carriers and introducing band bending in SiC to accumulate sufficient holes for etching. Through the combined anodic and MACE process the required electrical bias is greatly lowered (3.5 V for etching SiC and 7.5 V for creating SiC nanowires) while enhancing the etching efficiency. Furthermore, it is demonstrated that by tuning the etching electrical bias and time, various nanostructures can be obtained and the diameters of the obtained pores and nanowires can range from tens to hundreds of nanometers. This facile method may provide a feasible and economical way to fabricate SiC nanowires and nanostructures for broad applications.
All Author(s) ListChen Y., Zhang C., Li L., Zhou S., Chen X., Gao J., Zhao N., Wong C.
Journal nameSmall
Year2019
Month2
Volume Number15
Issue Number7
PublisherWiley: 12 months
Article number1803898
ISSN1613-6810
LanguagesEnglish-United Kingdom
Keywordshybrid anodic and metal-assisted chemical etching method, third-generation semiconductor material, silicon carbide (SiC) nanowires, silicon carbide (SiC) wet etching

Last updated on 2020-21-10 at 02:34