A novel method for accurate THz ellipsometry
Refereed conference paper presented and published in conference proceedings

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摘要We propose a novel method for establishing and aligning a THz ellipsometry system and for calibrating ellipsometry signals for precise THz ellipsometry measurements. The method significantly improves the THz ellipsometry accuracy compared to the current publications.
出版社接受日期06.05.2017
著者Xuequan Chen, Edward P. J. Parrott, Patrick Tekavec , Emma Pickwell-MacPherson
會議名稱42nd International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2017
會議開始日27.08.2017
會議完結日01.09.2017
會議地點Cancun, Mexico
會議國家/地區墨西哥
會議論文集題名A novel method for accurate THz ellipsometry
出版年份2017
出版社IEEE
出版地UNITED STATES OF AMERICA
國際標準書號978-150906048-1
國際標準期刊號21622027
語言英式英語
關鍵詞Ellipsometry, Time-domain analysis, Absorption, Geometry, Sensitivity, Reflection, Lenses

上次更新時間 2021-17-09 於 23:48