Lithography Hotspot Detection: From Shallow To Deep Learning
Invited conference paper presented and published in conference proceedings


Times Cited
Altmetrics Information
.

Other information
All Author(s) ListHaoyu Yang, Yajun Lin, Bei Yu, Evangeline F. Y. Young
Name of Conference30th IEEE International System-on-Chip Conference (SOCC)
Start Date of Conference05/09/2017
End Date of Conference08/09/2017
Place of ConferenceMunich
Country/Region of ConferenceGermany
Proceedings Title2017 30th IEEE International System-on-Chip Conference (SOCC)
Year2017
Pages233 - 238
ISBN978-153864033-3
ISSN21641676
LanguagesEnglish-United States

Last updated on 2020-05-07 at 00:41