The Visual Object Tracking VOT2015 challenge results
Refereed conference paper presented and published in conference proceedings


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All Author(s) ListM. Kristan, J. Matas, A. Leonardis, M. Felsberg, L. Cehovin, G. Fernández, T. Vojíř, G. Häger, G. Nebehay, R. Pflugfelder, A. Gupta, A. Bibi, A. Lukežič, A. Garcia-Martin, A. Petrosino, A. Saffari, A.S. Montero, A. Varfolomieiev, A. Baskurt, B. Zhao, B. Ghanem, B. Martinez, B. Lee, B. Han, C. Wang, C. Garcia, C. Zhang, C. Schmid, D. Tao, D. Kim, D. Huang, D. Prokhorov, D. Du, D.-Y. Yeung, E. Ribeiro, F.S. Khan, F. Porikli, F. Bunyak, G. Zhu, G. Seetharaman, H. Kieritz, H.T. Yau, H. Li, H. Qi, H. Bischof, H. Possegger, H. Lee, H. Nam, I. Bogun, J.-C. Jeong, J.-I. Cho, J.-Y. Lee, J. Zhu, J. Shi, J. Li, J. Jia, J. Feng, J. Gao, J.Y. Choi, J.-W. Kim, J. Lang, J.M. Martinez, J. Choi, J. Xing, K. Xue, K. Palaniappan, K. Lebeda, K. Alahari, K. Gao, K. Yun, K.H. Wong, L. Luo, L. Ma, L. Ke, L. Wen, L. Bertinetto, M. Pootschi, M. Maresca, M. Danelljan, M. Wen, M. Zhang, M. Arens, M. Valstar, M. Tang, M.-C. Chang, M.H. Khan, N. Fan, N. Wang, O. Mikšík, P. Torr, Q. Wang, R. Martin-Nieto, R. Pelapur, R. Bowden, R. Laganiere, S. Moujtahid, S. Hare, S. Hadfield, S. Lyu, S. Li, S.-C. Zhu, S. Becker, S. Duffner, S.L. Hicks, S. Golodetz, S. Choi, T. Wu, T. Mauthner, T. Pridmore, W. Hu, W. Hübner, X. Wang, X. Li, X. Shi, X. Zhao, X. Mei, Y. Shizeng, Y. Hua, Y. Li, Y. Lu, Y. Li, Z. Chen, Z. Huang, Z. Chen, Z. Zhang, Z. He, Z. Hong
Name of ConferenceIEEE International Conference on Computer Vision Workshops
Start Date of Conference11/12/2015
End Date of Conference18/12/2015
Place of ConferenceSantiago
Country/Region of ConferenceRepublic of Chile
Proceedings Title2015 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION WORKSHOP (ICCVW)
Title of PublicationThe Visual Object Tracking challenge 2015 (VOT2015)
Detailed descriptionICCV VOT-Workshop in conjunction with ICCV 2015. (NR)\n\nTo ORKTS: There are 128 authors in total. Please refer to the link of the paper for details.
Year2015
PublisherIEEE
Place of PublicationChile, Santiago de Chile
Pages564 - 586
ISBN978-0-7695-5720-5
LanguagesEnglish-United Kingdom

Last updated on 2020-07-08 at 00:08