A Study of AIOx Capped ZnO Thin Films by Conducting Atomic Force Microscopy and Scanning Kelvin Probe Microscopy
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All Author(s) ListAN Jin, XUE Kun, ONG Hock Chun Daniel, XU Jianbin
Name of ConferenceChina International Conference on Nanoscience & Technology 2005
Start Date of Conference09/06/2005
Country/Region of ConferenceChina
Proceedings TitleChina International Conference on Nanoscience & Technology 2005
Year2005
Month6
PublisherNational Center for Nanoscience and Technology of China
Place of PublicationChina, Beijing
Pages8
LanguagesEnglish-United Kingdom
KeywordsZnO; capped layer; AFM

Last updated on 2018-20-01 at 15:42