Charge Transport Properties in AIOx Capped ZnO Thin Films by Scanning Probe Microscopy
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All Author(s) ListAN Jin, HUI K C, XUE Kun, ONG Hock Chun Daniel, XU Jianbin
Name of Conference2005 MRS Spring Meeting
Start Date of Conference28/03/2005
Country/Region of ConferenceUnited States of America
Proceedings Title2005 MRS Spring Meeting
PublisherMaterials Research Society
Place of PublicationUnited States of America, San Francisco
LanguagesEnglish-United Kingdom
KeywordsZno; SPM; capped layer

Last updated on 2018-20-01 at 13:57