Local Characterization of Ultra-Thin HfO2 by In-Situ Ultrahigh Vacuum Scanning Tunneling Microscopy
Other conference paper

Full Text

Other information
All Author(s) ListWANG L, XUE Kun, XU Jianbin
Name of ConferenceMRS Fall 2005
Start Date of Conference28/11/2005
Country/Region of ConferenceUnited States of America
Proceedings TitleMRS Fall 2005
Place of PublicationUnited States of America, Boston
LanguagesEnglish-United Kingdom

Last updated on 2018-23-01 at 08:20