Local Characterization of Ultra-Thin HfO2 by In-Situ Ultrahigh Vacuum Scanning Tunneling Microscopy
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All Author(s) ListWANG L, XUE Kun, XU Jianbin
Name of ConferenceMRS Fall 2005
Start Date of Conference28/11/2005
Country/Region of ConferenceUnited States of America
Proceedings TitleMRS Fall 2005
Year2005
Month11
Day28
Place of PublicationUnited States of America, Boston
LanguagesEnglish-United Kingdom

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