Stochastic analysis on RAID reliability for solid-state drives
Refereed conference paper presented and published in conference proceedings

替代計量分析
.

其它資訊
摘要Solid-state drives (SSDs) have been widely deployed in desktops and data centers. However, SSDs suffer from bit errors, and the bit error rate is time dependent since it increases as an SSD wears down. Traditional storage systems mainly use parity-based RAID to provide reliability guarantees by striping redundancy across multiple devices, but the effectiveness of RAID in SSDs remains debatable as parity updates aggravate the wearing and bit error rates of SSDs. In particular, an open problem is that how different parity distributions over multiple devices, such as the even distribution suggested by conventional wisdom, or uneven distributions proposed in recent RAID schemes for SSDs, may influence the reliability of an SSD RAID array. To address this fundamental problem, we propose the first analytical model to quantify the reliability dynamics of an SSD RAID array. Specifically, we develop a 'non-homogeneous' continuous time Markov chain model, and derive the transient reliability solution. We validate our model via trace-driven simulations and conduct numerical analysis to provide insights into the reliability dynamics of SSD RAID arrays under different parity distributions and subject to different bit error rates and array configurations. Designers can use our model to decide the appropriate parity distribution based on their reliability requirements. © 2013 IEEE.
著者Li Y., Lee P.P.C., Lui J.C.S.
會議名稱2013 IEEE 32nd International Symposium on Reliable Distributed Systems, SRDS 2013
會議開始日01.10.2013
會議完結日03.10.2013
會議地點Braga
會議國家/地區葡萄牙
詳細描述organized by IEEE,
出版年份2013
月份12
日期1
頁次71 - 80
國際標準書號9780769551159
國際標準期刊號1060-9857
語言英式英語
關鍵詞CTMC, RAID, Reliability, Solid-state Drives, Transient Analysis

上次更新時間 2020-25-10 於 01:13