Layout-aware pseudo-functional testing for critical paths considering power supply noise effects
Refereed conference paper presented and published in conference proceedings

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AbstractWhen testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of the circuits. In this paper, we propose novel layout-aware pseudo-functional testing techniques to tackle the above problem. Firstly, by taking the circuit layout information into account, functional constraints related to delay faults on critical paths are extracted. Then, we generate functionally-reachable test cubes for every true critical path in the circuit. Finally, we fill the don't-care bits in the test cubes to maximize power supply noises on critical paths under the consideration of functional constraints. The effectiveness of the proposed methodology is verified with large ISCAS'89 benchmark circuits. © 2010 EDAA.
All Author(s) ListLiu X., Zhang Y., Yuan F., Xu Q.
Name of ConferenceDesign, Automation and Test in Europe Conference and Exhibition, DATE 2010
Start Date of Conference08/03/2010
End Date of Conference12/03/2010
Place of ConferenceDresden
Country/Region of ConferenceGermany
Detailed descriptionorganized by IEEE/ACM,
Pages1432 - 1437
LanguagesEnglish-United Kingdom

Last updated on 2020-02-09 at 00:24