On signal selection for visibility enhancement in trace-based post-silicon validation
Publication in refereed journal

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摘要Today's complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from pre-silicon verification. One effective silicon debug technique is to monitor and trace the behaviors of the circuit during its normal operation. However, due to the associated overhead, designers can only afford to trace a small number of signals in the design. Selecting which signals to trace is therefore a crucial issue for the effectiveness of this technique. This paper proposes an automated trace signal selection strategy with a new probability-based evaluation metric, which is able to dramatically enhance the visibility in post-silicon validation. Experimental results on benchmark circuits show that the proposed technique is more effective than existing solutions. © 1982-2012 IEEE.
著者Liu X., Xu Q.
期刊名稱IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
出版年份2012
月份7
日期27
卷號31
期次8
出版社Institute of Electrical and Electronics Engineers
出版地United States
頁次1263 - 1274
國際標準期刊號0278-0070
電子國際標準期刊號1937-4151
語言英式英語
關鍵詞Post-silicon validation, Trace signal selection, Visibility enhancement

上次更新時間 2020-19-10 於 02:48