Testing of synchronizers in asynchronous FIFO
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AbstractThis paper presents a test method for testing two-D-flip-flop synchronizers in an asynchronous first-in-first-out (FIFO) interface. A faulty synchronizer can have different fault behaviors depending on the input application time, the fault location, the fault mechanism, and the applied clock frequency. The proposed test method can apply the input patterns at different time and generate capture clock signals with different frequency regardless of phase-locked loop (PLL) of the design. To implement the proposed test method, channel delay compensator, delayed scan enable signal generator, launch clock generator, and capture clock generator are designed. In addition, a well-designed calibration method is proposed to calibrate all programmable delay elements used in the test circuits. The proposed test method evolves to several test sections to detect all possible faults of the two-D-flip-flop synchronizers in the asynchronous FIFO interface. © 2013 Springer Science+Business Media New York.
All Author(s) ListKim H.-K., Wang L.-T., Wu Y.-L., Jone W.-B.
Journal nameJournal of Electronic Testing
Detailed descriptionTo ORKTS: Other Keyword:
4. GALS
Year2013
Month2
Day14
Volume Number29
Issue Number1
PublisherKluwer Academic Publishers
Place of PublicationNetherlands
Pages49 - 72
ISSN0923-8174
LanguagesEnglish-United Kingdom
KeywordsAsynchronous FIFO, At-speed delay testing, GALS, Synchronizer

Last updated on 2020-17-10 at 02:52