Negative differential capacitance in copper phthalocyanine organic devices
Refereed conference paper presented and published in conference proceedings


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AbstractA remarkable dependence of negative differential capacitance (NDC) on bias voltage, frequency and temperature has been found in n-Si/copper phthalocyanine(CuPc)/Au devices. Annealing and thickness effects of CuPc thin films on NDC behavior were investigated. This NDC behavior is attributed to the charging-discharging current and inertial conducting current mode related to the localized states.
All Author(s) ListXu MS, Xu JB, Cheung WY
Name of ConferenceIEEE Hong Kong Electron Devices Meeting
Start Date of Conference30/06/2001
End Date of Conference30/06/2001
Place of ConferenceHong Kong
Country/Region of ConferenceHong Kong
Proceedings TitleProceedings 2001 IEEE Hong Kong Electron Devices Meeting
Title of PublicationPROCEEDINGS 2001 IEEE HONG KONG ELECTRON DEVICES MEETING
Year2001
PublisherIEEE
Pages122 - 125
ISBN0-7803-6714-6
LanguagesEnglish-United Kingdom
Keywordscopper phthalocyanine,C-V,localized states
Web of Science Subject CategoriesEngineering, Electrical & Electronic;Optics;Physics, Applied;Engineering;Optics;Physics

Last updated on 2021-05-05 at 01:44