Negative differential capacitance in copper phthalocyanine organic devices
Refereed conference paper presented and published in conference proceedings

香港中文大學研究人員

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摘要A remarkable dependence of negative differential capacitance (NDC) on bias voltage, frequency and temperature has been found in n-Si/copper phthalocyanine(CuPc)/Au devices. Annealing and thickness effects of CuPc thin films on NDC behavior were investigated. This NDC behavior is attributed to the charging-discharging current and inertial conducting current mode related to the localized states.
著者Xu MS, Xu JB, Cheung WY
會議名稱IEEE Hong Kong Electron Devices Meeting
會議開始日30.06.2001
會議完結日30.06.2001
會議地點Hong Kong
會議國家/地區香港
會議論文集題名Proceedings 2001 IEEE Hong Kong Electron Devices Meeting
出版作品名稱PROCEEDINGS 2001 IEEE HONG KONG ELECTRON DEVICES MEETING
出版年份2001
出版社IEEE
頁次122 - 125
國際標準書號0-7803-6714-6
語言英式英語
關鍵詞copper phthalocyanine,C-V,localized states
Web of Science 學科類別Engineering, Electrical & Electronic;Optics;Physics, Applied;Engineering;Optics;Physics

上次更新時間 2021-05-05 於 01:44