Preparation and characterization of piezoelectric (Pb.76Ca.24)TiO3 films
Refereed conference paper presented and published in conference proceedings


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AbstractTetragonal (Pb.76Ca.24)TiO3 thin films have been prepared on Pt/Ti/SiO2/Si substrates using sol-gel processing. Besides XRD, SEM and AFM characterization, ferroelectric hysteresis loop and dielectric measurement were used to characterize the electric properties. Piezoelectric-mode AFM was also used to investigate local ferrroelectric switching. Experimental results show that the films are pure pervoskite with a dense structure and small surface roughness. A high contrast in ferroelectric switching image was obtained. This is attributed to the large electrostriction coefficient and weak clamping effect from the substrate which is related with high piezoelectric anisotropy of this material. The discrepancy between the values of coercive fields from micro and macro measurement is attributed to the non-uniform distribution of electric field in the film in local measurement.
All Author(s) ListGuo HY, Wilson IH, Xu JB
Name of ConferenceIEEE Hong Kong Electron Devices Meeting
Start Date of Conference30/06/2001
End Date of Conference30/06/2001
Place of ConferenceHong Kong
Country/Region of ConferenceHong Kong
Proceedings TitleProceedings of IEEE Hong Kong Electron Device Meeting
Title of PublicationPROCEEDINGS 2001 IEEE HONG KONG ELECTRON DEVICES MEETING
Year2001
PublisherIEEE
Pages68 - 70
ISBN0-7803-6714-6
LanguagesEnglish-United Kingdom
Keywordspiezoelectric-mode AFM,(Pb.76Ca.24)TiO3
Web of Science Subject CategoriesEngineering, Electrical & Electronic;Optics;Physics, Applied;Engineering;Optics;Physics

Last updated on 2021-05-05 at 01:44