Preparation and characterization of piezoelectric (Pb.76Ca.24)TiO3 films
Refereed conference paper presented and published in conference proceedings

香港中文大學研究人員

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其它資訊
摘要Tetragonal (Pb.76Ca.24)TiO3 thin films have been prepared on Pt/Ti/SiO2/Si substrates using sol-gel processing. Besides XRD, SEM and AFM characterization, ferroelectric hysteresis loop and dielectric measurement were used to characterize the electric properties. Piezoelectric-mode AFM was also used to investigate local ferrroelectric switching. Experimental results show that the films are pure pervoskite with a dense structure and small surface roughness. A high contrast in ferroelectric switching image was obtained. This is attributed to the large electrostriction coefficient and weak clamping effect from the substrate which is related with high piezoelectric anisotropy of this material. The discrepancy between the values of coercive fields from micro and macro measurement is attributed to the non-uniform distribution of electric field in the film in local measurement.
著者Guo HY, Wilson IH, Xu JB
會議名稱IEEE Hong Kong Electron Devices Meeting
會議開始日30.06.2001
會議完結日30.06.2001
會議地點Hong Kong
會議國家/地區香港
會議論文集題名Proceedings of IEEE Hong Kong Electron Device Meeting
出版作品名稱PROCEEDINGS 2001 IEEE HONG KONG ELECTRON DEVICES MEETING
出版年份2001
出版社IEEE
頁次68 - 70
國際標準書號0-7803-6714-6
語言英式英語
關鍵詞piezoelectric-mode AFM,(Pb.76Ca.24)TiO3
Web of Science 學科類別Engineering, Electrical & Electronic;Optics;Physics, Applied;Engineering;Optics;Physics

上次更新時間 2021-05-05 於 01:44