Atomic force microscopic studies of porous TiO2 thin films prepared by the sol-gel method
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AbstractPorous titanium dioxide thin films were prepared from alkoxide solutions with and without polyethylene glycol (PEG) by the sol-gel method on soda-lime glass. The effects of PEG addition to the precursor solution on the microstructure and roughness of the resultant thin films were investigated by atomic force microscopy (AFM). It was found that TiO2 films prepared from the precursor solution without PEG had granular microstructure and flat texture, and was composed of about 100 nm spherical particles. With an increase in the times of coating cycles, the roughness of films decreased and the size of TiO2 particles increased. On the other hand, the larger the amount and molecular weight of the added PEG in precursor solutions, the larger the diameter and the depth of pores in the resultant films on the decomposition of PEG during heat-treatment. The surface of the films was also rougher, and fewer pores were produced during heat-treatment. The mechanism of porous structure formation in the TiO2 films was explained using the principle of spinodal phase separation.
All Author(s) ListYu JG, Yu JC, Cheng B, Zhao XJ, Zheng Z, Li ASK
Journal nameJournal of Sol-Gel Science and Technology
Year2002
Month7
Day1
Volume Number24
Issue Number3
PublisherKLUWER ACADEMIC PUBL
Pages229 - 240
ISSN0928-0707
eISSN1573-4846
LanguagesEnglish-United Kingdom
Keywordsatomic force microscopy; mechanism; phase separation; porous structure; sol-gel method; titanium dioxide thin films
Web of Science Subject CategoriesMaterials Science; Materials Science, Ceramics; MATERIALS SCIENCE, CERAMICS

Last updated on 2020-31-07 at 02:51