Domain imaging and local piezoelectric properties of the (200)-predominant SrBi2Ta2O9 thin film
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AbstractThe domain structure of the (200)-predominant SrBi2Ta2O9 (SBT) thin film was detected by an atomic force microscope in the piezoelectric mode. It was found that the content of the grains split by single domain walls is less than 5%. The types of domain walls formed in individual grains were identified by analyzing the dependence of piezoelectric coefficient (d(33)) on the alternating current driving electric field. Several grains larger than 300 nm were found to be split by non-180 degrees domain walls. To study the switching properties, the (200)-predominant SBT thin film was polarized and imaged over a large area. Unswitchable grains cannot be observed both in the area polarized using +8 V and in the region polarized using -8 V. (C) 1999 American Institute of Physics. [S0003-6951(99)02637-6].
All Author(s) ListHu GD, Xu JB, Wilson IH
Journal nameApplied Physics Letters
Year1999
Month9
Day13
Volume Number75
Issue Number11
PublisherAMER INST PHYSICS
Pages1610 - 1612
ISSN0003-6951
eISSN1077-3118
LanguagesEnglish-United Kingdom
Web of Science Subject CategoriesPhysics; Physics, Applied; PHYSICS, APPLIED

Last updated on 2021-22-02 at 00:00