Analysis of Reliability Dynamics of SSD RAID
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AbstractSolid-state drives (SSDs) have been widely deployed in desktops and data centers. However, SSDs suffer from bit errors, and the bit error rate is time dependent since it increases as an SSD wears down. Traditional storage systems mainly use parity-based RAID to provide reliability guarantees by striping redundancy across multiple devices, but the effectiveness of traditional RAID schemes in SSDs remains debatable. In particular, an open problem is how different parity distributions over multiple devices influence the reliability of an SSD RAID array. That is, should we evenly distribute patsaverties as suggested by conventional wisdom, or unevenly distribute parties as recently proposed for SSD RAID? To address this fundamental problem, we propose the first analytical model to quantify the reliability dynamics of an SSD RAID array as it ages. Specifically, we develop a "non-homogeneous" continuous time Markov chain model, and derive the transient reliability solution. We validate our model via trace-driven simulation and conduct numerical analysis to analyze the reliability dynamics of SSD RAID arrays subject to different parity distributions, error rates, and SSD array configurations. Our model enables system practitioners to decide the appropriate parity distribution based on their reliability requirements.
All Author(s) ListLi YK, Lee PPC, Lui JCS
Journal nameIEEE Transactions on Computers
Detailed description This journal was considered as a tier-A journal as classified by the external visiting committee in FoE in 2011.
Year2016
Month4
Day1
Volume Number65
Issue Number4
PublisherIEEE COMPUTER SOC
Pages1131 - 1144
ISSN0018-9340
eISSN1557-9956
LanguagesEnglish-United Kingdom
KeywordsCTMC; RAID; reliability; Solid-state drives; transient analysis
Web of Science Subject CategoriesComputer Science; Computer Science, Hardware & Architecture; Engineering; Engineering, Electrical & Electronic

Last updated on 2021-20-01 at 01:45