Broadband Spectrometers Based on Nano-scale Difference Interferometers
Refereed conference paper presented and published in conference proceedings

香港中文大學研究人員

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替代計量分析
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其它資訊
摘要We present a chip-level integrated optical spectrometer and demonstrate its broadband and high resolution performance by using FDTD simulations. Designs of extruded and the pit structures show that the proposed device is low-cost and easy to fabricate as well.
著者Yang T, Li CC, Zhang HX, Ho HP
會議名稱3rd IEEE International Nanoelectronics Conference
會議開始日03.01.2010
會議完結日08.01.2010
會議地點Hong Kong
會議國家/地區中國
出版年份2010
月份1
日期1
出版社IEEE
頁次297 - 298
國際標準書號978-1-4244-3543-2
語言英式英語
Web of Science 學科類別Engineering; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Science & Technology - Other Topics

上次更新時間 2021-14-04 於 23:31