Advanced denoising for X-ray ptychography
Publication in refereed journal

香港中文大學研究人員
替代計量分析
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其它資訊
摘要The success of ptychographic imaging experiments strongly depends on achieving high signal-to-noise ratio. This is particularly important in nanoscale imaging experiments when diffraction signals are very weak and the experiments are accompanied by significant parasitic scattering (background), outliers or correlated noise sources. It is also critical when rare events, such as cosmic rays, or bad frames caused by electronic glitches or shutter timing malfunction take place. In this paper, we propose a novel iterative algorithm with rigorous analysis that exploits the direct forward model for parasitic noise and sample smoothness to achieve a thorough characterization and removal of structured and random noise. We present a formal description of the proposed algorithm and prove its convergence under mild conditions. Numerical experiments from simulations and real data (both soft and hard X-ray beamlines) demonstrate that the proposed algorithms produce better results when compared to state-of-the-art methods.
著者Huibin Chang, Pablo Enfedaque, Jie Zhang, Juliane Reinhardt, Bjoern Enders, Young-Sang Yu, David Shapiro, Christian G. Schroer, Tieyong Zeng, and Stefano Marchesini
期刊名稱Optics express
出版年份2019
月份4
日期15
卷號27
期次8
出版社Optical Society of America
出版地2019
頁次10395 - 10418
語言英式英語

上次更新時間 2020-23-09 於 23:10